Ключевые слова: coated conductors, fabrication, substrate Ni-W, buffer layers, texture, chemical solution deposition
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Rubanov S., Armenio A.A., Pinto V.
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Barba L., Arrighetti G., Campi G.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Torokhtii K., Frolova A.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanodoping, critical caracteristics, pinning, measurement technique, critical current density, microwave devices, Jc/B curves, pinning force, angular dependence, surface impedance, magnetic field dependence, nitrogen liquid , experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Bianchetti M., Armenio A.A., Meledin A., Pinto V.
Ключевые слова: HTS, YBCO, films, nanoscaled effects, nanodoping, irreversibility fields, pinning centers artificial, defects columnar, PLD process, substrate SrTiO3, microstructure, critical caracteristics, Jc/B curves, critical current density, angular dependence, pinning force, experimental results
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Silva E., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Lamanna R.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Armenio A.A., Sotgiu G., Torokhtii K., Pinto V., Frolova A.
Zenobio A.D., Chiarelli S., Rufoloni A., Muzzi L., Corato V., Marzi G.D., Viola R., Corte A.D., Freda R., Formichetti A.
Ключевые слова: HTS, coated conductors, buffer layers, multilayered structures, PLD process, YBCO, substrate Ni-W, substrate Cu alloy, microstructure, texture, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V.
Ключевые слова: coated conductors, HTS, aspect ratios, REBCO, substrate Cu, texture, fabrication
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Thalmaier G., Armenio A.A.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, substrate Ni-W, thickness dependence, separation layer, buffer layers, resistivity, temperature dependence
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Pompeo N., Silva E., Angrisani A.A., Colantoni I., Davoli I., Sotgiu G., Mancini R.
Galluzzi V., Gambardella U., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Saggese A., Messina G., Armenio A.A., Sabatino P., Iannone G.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Celentano G., Gabor M.S., Mos R.B., Petrisor T.*Jr.1, Falqui A., Genovese A., Ruffilli R.
Ключевые слова: HTS, coated conductors, substrate Ni-W, RABITS process, buffer layers, chemical solution deposition, films epitaxial, YBCO, PLD process, microstructure, fabrication
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Pompeo N., Silva E., Armenio A.A., Contini G., Freda R., Sotgiu G., Torokhtii K., Bemporad E.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Pompeo N., Silva E., Angrisani A.A., Colantoni I., Davoli I., Sotgiu G., Mancini R.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, fabrication, chemical solution deposition, buffer layers, MOD process, critical caracteristics, Jc/B curves
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